A low-temperature high resolution scanning tunneling microscope with a three-dimensional magnetic vector field operating in ultrahigh vacuum.
Identifieur interne : 002056 ( Main/Exploration ); précédent : 002055; suivant : 002057A low-temperature high resolution scanning tunneling microscope with a three-dimensional magnetic vector field operating in ultrahigh vacuum.
Auteurs : RBID : pubmed:19485511Abstract
We present a low-temperature ultrahigh vacuum (UHV) scanning tunneling microscope setup with a combination of a superconducting solenoid coil and two split-pair magnets, providing a rotatable magnetic field up to 500 mT applicable in all spatial directions. An absolute field maximum of B=7 T(3 T) can be applied perpendicular (parallel) to the sample surface. The instrument is operated at a temperature of 4.8 K. Topographic and spectroscopic measurements on tungsten carbide and indium antimonide revealed a z-noise of 300 fm(pp), which barely changes in magnetic field. The microscope is equipped with a tip exchange mechanism and a lateral sample positioning stage, which allows exact positioning of the tip with an accuracy of 5 microm prior to the measurement. Additional contacts to the sample holder allow, e.g., the application of an additional gate voltage. The UHV part of the system contains versatile possibilities of in situ sample and tip preparation as well as low-energy electron diffraction and Auger analysis.
DOI: 10.1063/1.3127589
PubMed: 19485511
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Le document en format XML
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<author><name sortKey="Mashoff, T" uniqKey="Mashoff T">T Mashoff</name>
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<author><name sortKey="Pratzer, M" uniqKey="Pratzer M">M Pratzer</name>
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<front><div type="abstract" xml:lang="en">We present a low-temperature ultrahigh vacuum (UHV) scanning tunneling microscope setup with a combination of a superconducting solenoid coil and two split-pair magnets, providing a rotatable magnetic field up to 500 mT applicable in all spatial directions. An absolute field maximum of B=7 T(3 T) can be applied perpendicular (parallel) to the sample surface. The instrument is operated at a temperature of 4.8 K. Topographic and spectroscopic measurements on tungsten carbide and indium antimonide revealed a z-noise of 300 fm(pp), which barely changes in magnetic field. The microscope is equipped with a tip exchange mechanism and a lateral sample positioning stage, which allows exact positioning of the tip with an accuracy of 5 microm prior to the measurement. Additional contacts to the sample holder allow, e.g., the application of an additional gate voltage. The UHV part of the system contains versatile possibilities of in situ sample and tip preparation as well as low-energy electron diffraction and Auger analysis.</div>
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<Title>The Review of scientific instruments</Title>
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<Abstract><AbstractText>We present a low-temperature ultrahigh vacuum (UHV) scanning tunneling microscope setup with a combination of a superconducting solenoid coil and two split-pair magnets, providing a rotatable magnetic field up to 500 mT applicable in all spatial directions. An absolute field maximum of B=7 T(3 T) can be applied perpendicular (parallel) to the sample surface. The instrument is operated at a temperature of 4.8 K. Topographic and spectroscopic measurements on tungsten carbide and indium antimonide revealed a z-noise of 300 fm(pp), which barely changes in magnetic field. The microscope is equipped with a tip exchange mechanism and a lateral sample positioning stage, which allows exact positioning of the tip with an accuracy of 5 microm prior to the measurement. Additional contacts to the sample holder allow, e.g., the application of an additional gate voltage. The UHV part of the system contains versatile possibilities of in situ sample and tip preparation as well as low-energy electron diffraction and Auger analysis.</AbstractText>
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